%0 Journal Article %1 journals/integration/DingCGXG23 %A Ding, Liqiang %A Cai, Xiaowu %A Gao, Mali %A Xia, Ruirui %A Gao, Yuexin %D 2023 %J Integr. %K dblp %P 166-172 %T A high reliability under-voltage lock out circuit for power driver IC. %U http://dblp.uni-trier.de/db/journals/integration/integration88.html#DingCGXG23 %V 88

@article{journals/integration/DingCGXG23, added-at = {2022-12-07T00:00:00.000+0100}, author = {Ding, Liqiang and Cai, Xiaowu and Gao, Mali and Xia, Ruirui and Gao, Yuexin}, biburl = {https://www.bibsonomy.org/bibtex/2aa84b63b4070f8a775780d9091e30ca3/dblp}, ee = {https://doi.org/10.1016/j.vlsi.2022.09.011}, interhash = {245744e776630a1a54a99695ab5d08bb}, intrahash = {aa84b63b4070f8a775780d9091e30ca3}, journal = {Integr.}, keywords = {dblp}, pages = {166-172}, timestamp = {2024-04-08T13:14:52.000+0200}, title = {A high reliability under-voltage lock out circuit for power driver IC.}, url = {http://dblp.uni-trier.de/db/journals/integration/integration88.html#DingCGXG23}, volume = 88, year = 2023 }