%0 Conference Paper %1 conf/dsd/RaikUKK07 %A Raik, Jaan %A Ubar, Raimund %A Krivenko, Anna %A Kruus, Margus %B DSD %D 2007 %I IEEE Computer Society %K dblp %P 668-671 %T Hierarchical Identification of Untestable Faults in Sequential Circuits. %U http://dblp.uni-trier.de/db/conf/dsd/dsd2007.html#RaikUKK07 %@ 0-7695-2978-X

@inproceedings{conf/dsd/RaikUKK07, added-at = {2017-05-19T00:00:00.000+0200}, author = {Raik, Jaan and Ubar, Raimund and Krivenko, Anna and Kruus, Margus}, biburl = {https://www.bibsonomy.org/bibtex/24fe4eca403125bdc0b05aca2212a8b72/dblp}, booktitle = {DSD}, crossref = {conf/dsd/2007}, ee = {https://doi.org/10.1109/DSD.2007.4341539}, interhash = {65d57bf47ae5116f42c43a13484a9053}, intrahash = {4fe4eca403125bdc0b05aca2212a8b72}, isbn = {0-7695-2978-X}, keywords = {dblp}, pages = {668-671}, publisher = {IEEE Computer Society}, timestamp = {2019-10-17T15:23:55.000+0200}, title = {Hierarchical Identification of Untestable Faults in Sequential Circuits.}, url = {http://dblp.uni-trier.de/db/conf/dsd/dsd2007.html#RaikUKK07}, year = 2007 }