%0 Conference Paper %1 conf/vlsid/LinRR15 %A Lin, Xijiang %A Reddy, Sudhakar M. %A Rajski, Janusz %B VLSID %D 2015 %I IEEE Computer Society %K dblp %P 399-404 %T Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits. %U http://dblp.uni-trier.de/db/conf/vlsid/vlsid2015.html#LinRR15 %@ 978-1-4799-6658-5

@inproceedings{conf/vlsid/LinRR15, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lin, Xijiang and Reddy, Sudhakar M. and Rajski, Janusz}, biburl = {https://www.bibsonomy.org/bibtex/26ffc99a06d5ba88fc0bf019525e3d7e7/dblp}, booktitle = {VLSID}, crossref = {conf/vlsid/2015}, ee = {https://doi.ieeecomputersociety.org/10.1109/VLSID.2015.73}, interhash = {08b0df0ce8f4eb1683a5503db526255d}, intrahash = {6ffc99a06d5ba88fc0bf019525e3d7e7}, isbn = {978-1-4799-6658-5}, keywords = {dblp}, pages = {399-404}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T01:05:03.000+0200}, title = {Using Boolean Tests to Improve Detection of Transistor Stuck-Open Faults in CMOS Digital Logic Circuits.}, url = {http://dblp.uni-trier.de/db/conf/vlsid/vlsid2015.html#LinRR15}, year = 2015 }