Inproceedings,
Multi-cell soft errors at the 16-nm FinFET technology node.
N. Tam, B. Bhuva, L. Massengill, D. Ball, M. McCurdy, M. Alles, and I. Chatterjee.IRPS, page 4. IEEE, (2015)
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- conf/irps/TamBMBMAC15
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- inproceedings
- booktitle
- IRPS
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- 2015
- pages
- 4
- publisher
- IEEE
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- conf/irps/2015
- ee
- https://doi.org/10.1109/IRPS.2015.7112730
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- 978-1-4673-7362-3
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- http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TamBMBMAC15
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- please select -%0 Conference Paper
%1 conf/irps/TamBMBMAC15
%A Tam, N.
%A Bhuva, Bharat L.
%A Massengill, Lloyd W.
%A Ball, Dennis R.
%A McCurdy, Michael W.
%A Alles, Michael L.
%A Chatterjee, Indranil
%B IRPS
%D 2015
%I IEEE
%K dblp
%P 4
%T Multi-cell soft errors at the 16-nm FinFET technology node.
%U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TamBMBMAC15
%@ 978-1-4673-7362-3
@inproceedings{conf/irps/TamBMBMAC15,
added-at = {2023-05-24T00:00:00.000+0200},
author = {Tam, N. and Bhuva, Bharat L. and Massengill, Lloyd W. and Ball, Dennis R. and McCurdy, Michael W. and Alles, Michael L. and Chatterjee, Indranil},
biburl = {https://www.bibsonomy.org/bibtex/2a758d0854a1711f03f571c9c3f267c02/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2015},
ee = {https://doi.org/10.1109/IRPS.2015.7112730},
interhash = {2704ab459af32a45054be97c288b7691},
intrahash = {a758d0854a1711f03f571c9c3f267c02},
isbn = {978-1-4673-7362-3},
keywords = {dblp},
pages = 4,
publisher = {IEEE},
timestamp = {2024-04-10T16:54:51.000+0200},
title = {Multi-cell soft errors at the 16-nm FinFET technology node.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TamBMBMAC15},
year = 2015
}