SEU error which is made by various radiations affects the signal integrity of nano-scale circuits, especially for future ultra-large and complex circuits. In this paper, we proposed a SEU error model for three-dimensional FPGAs and evaluate the SEU error of 3D-FPGAs based on the proposed model and then compare the SEU error rate of 3D-FPGAs with 2D-FPGAs. Moreover, we proposed a 3D layer assignment for improving SEU error possibility on three-dimensional FPGAs. The experimental results show that SEU error rate and critical delay decreases about 67% and 13.1% on 4 layers 3D-FPGA compared with 2D-FPGAs, respectively. In addition, the proposed layer assignment improves the possibility of SEU error of 3D-FPGAs up to 6.5% for large FPGA circuits.
Description
IEEE Xplore Abstract - Modeling, evaluation and mitigation of SEU error in three-dimensional FPGAs
%0 Conference Paper
%1 osgooi2012modeling
%A Osgooi, M.N.
%A Jahanian, A.
%A Zarandi, H.-R.
%B Computer Architecture and Digital Systems (CADS), 2012 16th CSI International Symposium on
%D 2012
%K fpga seu
%P 31-36
%R 10.1109/CADS.2012.6316415
%T Modeling, evaluation and mitigation of SEU error in three-dimensional FPGAs
%U http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6316415&navigation=1
%X SEU error which is made by various radiations affects the signal integrity of nano-scale circuits, especially for future ultra-large and complex circuits. In this paper, we proposed a SEU error model for three-dimensional FPGAs and evaluate the SEU error of 3D-FPGAs based on the proposed model and then compare the SEU error rate of 3D-FPGAs with 2D-FPGAs. Moreover, we proposed a 3D layer assignment for improving SEU error possibility on three-dimensional FPGAs. The experimental results show that SEU error rate and critical delay decreases about 67% and 13.1% on 4 layers 3D-FPGA compared with 2D-FPGAs, respectively. In addition, the proposed layer assignment improves the possibility of SEU error of 3D-FPGAs up to 6.5% for large FPGA circuits.
@inproceedings{osgooi2012modeling,
abstract = {SEU error which is made by various radiations affects the signal integrity of nano-scale circuits, especially for future ultra-large and complex circuits. In this paper, we proposed a SEU error model for three-dimensional FPGAs and evaluate the SEU error of 3D-FPGAs based on the proposed model and then compare the SEU error rate of 3D-FPGAs with 2D-FPGAs. Moreover, we proposed a 3D layer assignment for improving SEU error possibility on three-dimensional FPGAs. The experimental results show that SEU error rate and critical delay decreases about 67% and 13.1% on 4 layers 3D-FPGA compared with 2D-FPGAs, respectively. In addition, the proposed layer assignment improves the possibility of SEU error of 3D-FPGAs up to 6.5% for large FPGA circuits.},
added-at = {2014-10-15T13:34:08.000+0200},
author = {Osgooi, M.N. and Jahanian, A. and Zarandi, H.-R.},
biburl = {https://www.bibsonomy.org/bibtex/278867e33b4f26e487e0babbffc2ee753/eberle18},
booktitle = {Computer Architecture and Digital Systems (CADS), 2012 16th CSI International Symposium on},
description = {IEEE Xplore Abstract - Modeling, evaluation and mitigation of SEU error in three-dimensional FPGAs},
doi = {10.1109/CADS.2012.6316415},
interhash = {51ec32649f4347d6b73d9a0fc1f4a526},
intrahash = {78867e33b4f26e487e0babbffc2ee753},
keywords = {fpga seu},
month = may,
pages = {31-36},
timestamp = {2014-10-15T13:34:08.000+0200},
title = {Modeling, evaluation and mitigation of SEU error in three-dimensional FPGAs},
url = {http://ieeexplore.ieee.org/xpl/articleDetails.jsp?arnumber=6316415&navigation=1},
year = 2012
}