%0 Conference Paper %1 conf/iccad/DadgourDB08 %A Dadgour, Hamed F. %A De, Vivek %A Banerjee, Kaustav %B ICCAD %D 2008 %E Nassif, Sani R. %E Roychowdhury, Jaijeet S. %I IEEE Computer Society %K dblp %P 270-277 %T Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design. %U http://dblp.uni-trier.de/db/conf/iccad/iccad2008.html#DadgourDB08 %@ 978-1-4244-2820-5

@inproceedings{conf/iccad/DadgourDB08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Dadgour, Hamed F. and De, Vivek and Banerjee, Kaustav}, biburl = {https://www.bibsonomy.org/bibtex/2794711451dc6668e7d1547e0934d3553/dblp}, booktitle = {ICCAD}, crossref = {conf/iccad/2008}, editor = {Nassif, Sani R. and Roychowdhury, Jaijeet S.}, ee = {https://dl.acm.org/citation.cfm?id=1509523}, interhash = {b9ff5ebb04808d9ca336a803e18b303f}, intrahash = {794711451dc6668e7d1547e0934d3553}, isbn = {978-1-4244-2820-5}, keywords = {dblp}, pages = {270-277}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T17:54:13.000+0200}, title = {Statistical modeling of metal-gate work-function variability in emerging device technologies and implications for circuit design.}, url = {http://dblp.uni-trier.de/db/conf/iccad/iccad2008.html#DadgourDB08}, year = 2008 }