Abstract

We analyzed low-background data from the CRESST-II experiment with a total net exposure of 730 kg days to extract limits on double electron capture processes. We established new limits for 40 Ca with ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn1.gif $T_1/2^22K9.910^21$ y and ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn2.gif $T_1/2^02EC1.410^22$ y and for 180 W with ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn3.gif $T_1/2^22K3.110^19$ y and ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn4.gif $T_1/2^02EC9.410^18$ y at 90% CL. Depending on the process, these values improve the currently best limits by a factor of ##IMG## http://ej.iop.org/images/0954-3899/43/9/095202/jpgaa33bcieqn5.gif $1.4--30$ .

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New limits on double electron capture of 40Ca and 180W - IOPscience

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