%0 Conference Paper %1 conf/itc/Crosby83 %A Crosby, Brian C. %B ITC %D 1983 %I IEEE Computer Society %K dblp %P 51-56 %T FAST Technology In-Circuit Testing Considerations. %U http://dblp.uni-trier.de/db/conf/itc/itc1983.html#Crosby83

@inproceedings{conf/itc/Crosby83, added-at = {2002-11-05T00:00:00.000+0100}, author = {Crosby, Brian C.}, biburl = {https://www.bibsonomy.org/bibtex/29208eb0191f58e769b7560689baa59e1/dblp}, booktitle = {ITC}, crossref = {conf/itc/1983}, date = {2002-11-05}, description = {dblp}, interhash = {48e4a8f4e4e3fe818422fc70141d3112}, intrahash = {9208eb0191f58e769b7560689baa59e1}, keywords = {dblp}, pages = {51-56}, publisher = {IEEE Computer Society}, timestamp = {2002-11-05T00:00:00.000+0100}, title = {FAST Technology In-Circuit Testing Considerations.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1983.html#Crosby83}, year = 1983 }