%0 Journal Article %1 journals/mr/LiaoMB07 %A Liao, Joy Y. %A Marks, Howard L. %A Beaudoin, F. %D 2007 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1565-1568 %T OBIRCH analysis of electrically stressed advanced graphic ICs. %U http://dblp.uni-trier.de/db/journals/mr/mr47.html#LiaoMB07 %V 47

@article{journals/mr/LiaoMB07, added-at = {2020-02-22T00:00:00.000+0100}, author = {Liao, Joy Y. and Marks, Howard L. and Beaudoin, F.}, biburl = {https://www.bibsonomy.org/bibtex/2a28480f4c3ab7b569b6aa64abfdd2c0f/dblp}, ee = {https://doi.org/10.1016/j.microrel.2007.07.047}, interhash = {4957e1d85ad077c59010a8d66abd747c}, intrahash = {a28480f4c3ab7b569b6aa64abfdd2c0f}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1565-1568}, timestamp = {2020-02-25T13:24:16.000+0100}, title = {OBIRCH analysis of electrically stressed advanced graphic ICs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr47.html#LiaoMB07}, volume = 47, year = 2007 }