The construction criteria and the two major evaluation methods of fault trees are briefly discussed. The equations of the basic logic units (OR-gate and AND-gate) of the tree are derived. The probability evaluation and the failure rate evaluation methods are each illustrated by means of a simple example. The effect of active redundancy on the failure rate of a system and its calculation methods are discussed in more detail.
%0 Journal Article
%1 nieuwhof1975introduction
%A Nieuwhof, G.W.E.
%D 1975
%J Microelectronics Reliability
%K 62n05-reliability-and-life-testing fault-tree-analysis
%N 2
%P 105-119
%R 10.1016/0026-2714(75)90024-4
%T An introduction to fault tree analysis with emphasis on failure rate evaluation
%U https://www.sciencedirect.com/science/article/pii/0026271475900244
%V 14
%X The construction criteria and the two major evaluation methods of fault trees are briefly discussed. The equations of the basic logic units (OR-gate and AND-gate) of the tree are derived. The probability evaluation and the failure rate evaluation methods are each illustrated by means of a simple example. The effect of active redundancy on the failure rate of a system and its calculation methods are discussed in more detail.
@article{nieuwhof1975introduction,
abstract = {The construction criteria and the two major evaluation methods of fault trees are briefly discussed. The equations of the basic logic units (OR-gate and AND-gate) of the tree are derived. The probability evaluation and the failure rate evaluation methods are each illustrated by means of a simple example. The effect of active redundancy on the failure rate of a system and its calculation methods are discussed in more detail.},
added-at = {2023-12-22T01:59:38.000+0100},
author = {Nieuwhof, G.W.E.},
biburl = {https://www.bibsonomy.org/bibtex/2f0794cd7202a839f0491e3d216bda7b2/gdmcbain},
doi = {10.1016/0026-2714(75)90024-4},
interhash = {954a9e2131d7dd075cfde774dc002f6d},
intrahash = {f0794cd7202a839f0491e3d216bda7b2},
issn = {0026-2714},
journal = {Microelectronics Reliability},
keywords = {62n05-reliability-and-life-testing fault-tree-analysis},
number = 2,
pages = {105-119},
timestamp = {2023-12-22T01:59:38.000+0100},
title = {An introduction to fault tree analysis with emphasis on failure rate evaluation},
url = {https://www.sciencedirect.com/science/article/pii/0026271475900244},
volume = 14,
year = 1975
}