%0 Conference Paper %1 conf/isqed/DattaADRTCSCTKSBPYT13 %A Datta, Animesh %A Abu-Rahma, Mohamed H. %A Dasnurkar, Sachin Dileep %A Rasouli, Hadi %A Tamjidi, Sean %A Cai, Ming %A Sengupta, Samit %A Chidambaram, P. R. %A Thirumala, Raghavan %A Kulkarni, Nikhil %A Seeram, Prasanna %A Bhadri, Prasad %A Patel, Prayag %A Yoon, Sei Seung %A Terzioglu, Esin %B ISQED %D 2013 %I IEEE %K dblp %P 580-584 %T Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology. %U http://dblp.uni-trier.de/db/conf/isqed/isqed2013.html#DattaADRTCSCTKSBPYT13 %@ 978-1-4673-4951-2

@inproceedings{conf/isqed/DattaADRTCSCTKSBPYT13, added-at = {2013-06-10T00:00:00.000+0200}, author = {Datta, Animesh and Abu-Rahma, Mohamed H. and Dasnurkar, Sachin Dileep and Rasouli, Hadi and Tamjidi, Sean and Cai, Ming and Sengupta, Samit and Chidambaram, P. R. and Thirumala, Raghavan and Kulkarni, Nikhil and Seeram, Prasanna and Bhadri, Prasad and Patel, Prayag and Yoon, Sei Seung and Terzioglu, Esin}, biburl = {https://www.bibsonomy.org/bibtex/20669353d6fe4cd2dad418e880ff15aa4/dblp}, booktitle = {ISQED}, crossref = {conf/isqed/2013}, ee = {http://dx.doi.org/10.1109/ISQED.2013.6523669}, interhash = {2f26c451429246b98853ef5abf908a28}, intrahash = {0669353d6fe4cd2dad418e880ff15aa4}, isbn = {978-1-4673-4951-2}, keywords = {dblp}, pages = {580-584}, publisher = {IEEE}, timestamp = {2013-08-13T14:46:02.000+0200}, title = {Analysis, modeling and silicon correlation of low-voltage flop data retention in 28nm process technology.}, url = {http://dblp.uni-trier.de/db/conf/isqed/isqed2013.html#DattaADRTCSCTKSBPYT13}, year = 2013 }