%0 Conference Paper %1 conf/itc/DaltonADSCKS86 %A Dalton, Earl %A Ahern, Walter %A Denker, Stephen %A Sweitzer, Ken %A Cooper, Bill %A Kelly, Tom %A Smith, Stan %B ITC %D 1986 %I IEEE Computer Society %K %P 80-83 %T Systematic Yield Improvement in Board Testing Practice. %U http://dblp.uni-trier.de/db/conf/itc/itc1986.html#DaltonADSCKS86

@inproceedings{conf/itc/DaltonADSCKS86, added-at = {2023-12-12T20:58:56.000+0100}, author = {Dalton, Earl and Ahern, Walter and Denker, Stephen and Sweitzer, Ken and Cooper, Bill and Kelly, Tom and Smith, Stan}, biburl = {https://www.bibsonomy.org/bibtex/28fb9c4eae871876686fde7ae5a07ef00/admin}, booktitle = {ITC}, crossref = {conf/itc/1986}, date = {2002-10-22}, interhash = {374c2f1ff0efd823498e191fb3c5c668}, intrahash = {8fb9c4eae871876686fde7ae5a07ef00}, keywords = {}, pages = {80-83}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T20:58:56.000+0100}, title = {Systematic Yield Improvement in Board Testing Practice.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1986.html#DaltonADSCKS86}, year = 1986 }