%0 Journal Article %1 journals/ieicet/FuruyaYS95 %A Furuya, Kiyoshi %A Yamazaki, Susumu %A Sato, Masayuki %D 1995 %J IEICE Trans. Inf. Syst. %K dblp %N 7 %P 889-894 %T Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing. %U http://dblp.uni-trier.de/db/journals/ieicet/ieicet78d.html#FuruyaYS95 %V 78-D

@article{journals/ieicet/FuruyaYS95, added-at = {2020-04-11T00:00:00.000+0200}, author = {Furuya, Kiyoshi and Yamazaki, Susumu and Sato, Masayuki}, biburl = {https://www.bibsonomy.org/bibtex/218fc70868df4dc20099276d119f0bae6/dblp}, ee = {http://search.ieice.org/bin/summary.php?id=e78-d_7_889}, interhash = {385539ac0310e5e06bc1864006e3d9e3}, intrahash = {18fc70868df4dc20099276d119f0bae6}, journal = {IEICE Trans. Inf. Syst.}, keywords = {dblp}, number = 7, pages = {889-894}, timestamp = {2020-04-14T11:41:35.000+0200}, title = {Stuck-Open Fault Detectabilities of Various TPG Circuits for Use in Two-Pattern Testing.}, url = {http://dblp.uni-trier.de/db/journals/ieicet/ieicet78d.html#FuruyaYS95}, volume = {78-D}, year = 1995 }