%0 Conference Paper %1 conf/irps/MalikJCMKSBVS23 %A Malik, Rasik Rashid %A Joshi, Vipin %A Chaudhuri, Rajarshi Roy %A Mir, Mehak Ashraf %A Khan, Zubear %A Shaji, Avinas N. %A Bhattacharya, Madhura %A Vitthal, Anup T. %A Shrivastava, Mayank %B IRPS %D 2023 %I IEEE %K dblp %P 1-4 %T Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#MalikJCMKSBVS23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/MalikJCMKSBVS23, added-at = {2024-10-06T00:00:00.000+0200}, author = {Malik, Rasik Rashid and Joshi, Vipin and Chaudhuri, Rajarshi Roy and Mir, Mehak Ashraf and Khan, Zubear and Shaji, Avinas N. and Bhattacharya, Madhura and Vitthal, Anup T. and Shrivastava, Mayank}, biburl = {https://www.bibsonomy.org/bibtex/261b6f5a6975d7aa34cb38592d69c3b9b/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117793}, interhash = {3a5438a9c1817b658fe0029e3ac5db04}, intrahash = {61b6f5a6975d7aa34cb38592d69c3b9b}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-4}, publisher = {IEEE}, timestamp = {2024-10-07T09:55:13.000+0200}, title = {Signatures of Positive Gate Over-Drive Induced Hole Trap Generation and its Impact on p-GaN Gate Stack Instability in AlGaN/GaN HEMTs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#MalikJCMKSBVS23}, year = 2023 }