%0 Journal Article %1 journals/mr/MeneghessoCMPV02 %A Meneghesso, Gaudenzio %A Cocco, A. %A Mura, Giovanna %A Podda, Simona %A Vanzi, Massimo %D 2002 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1293-1298 %T Backside Failure Analysis of GaAs ICs after ESD tests. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#MeneghessoCMPV02 %V 42

@article{journals/mr/MeneghessoCMPV02, added-at = {2023-03-21T00:00:00.000+0100}, author = {Meneghesso, Gaudenzio and Cocco, A. and Mura, Giovanna and Podda, Simona and Vanzi, Massimo}, biburl = {https://www.bibsonomy.org/bibtex/2e347085caf176408326cbd7f1badc7f7/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00137-3}, interhash = {3bd08e3a766d6a2a35be1413c0bd469c}, intrahash = {e347085caf176408326cbd7f1badc7f7}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1293-1298}, timestamp = {2024-04-09T02:50:29.000+0200}, title = {Backside Failure Analysis of GaAs ICs after ESD tests.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#MeneghessoCMPV02}, volume = 42, year = 2002 }