%0 Conference Paper %1 conf/irps/XuCBCFWFB20 %A Xu, Lyuan %A Cao, Jingchen %A Brockman, John %A Cazzaniga, Carlo %A Frost, Christopher %A Wen, Shi-Jie %A Fung, Rita %A Bhuva, Bharat L. %B IRPS %D 2020 %I IEEE %K dblp %P 1-5 %T Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node. %U http://dblp.uni-trier.de/db/conf/irps/irps2020.html#XuCBCFWFB20 %@ 978-1-7281-3199-3

@inproceedings{conf/irps/XuCBCFWFB20, added-at = {2021-01-21T00:00:00.000+0100}, author = {Xu, Lyuan and Cao, Jingchen and Brockman, John and Cazzaniga, Carlo and Frost, Christopher and Wen, Shi-Jie and Fung, Rita and Bhuva, Bharat L.}, biburl = {https://www.bibsonomy.org/bibtex/28d167a1069b87a88b68c0f3626c57fdd/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2020}, ee = {https://doi.org/10.1109/IRPS45951.2020.9128360}, interhash = {408fc49828ad96ad64bf8ffcae4ab007}, intrahash = {8d167a1069b87a88b68c0f3626c57fdd}, isbn = {978-1-7281-3199-3}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2024-04-10T16:56:46.000+0200}, title = {Thermal Neutron Induced Soft Errors in 7-nm Bulk FinFET Node.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2020.html#XuCBCFWFB20}, year = 2020 }