%0 Conference Paper %1 conf/itc/Crosby82 %A Crosby, Brian C. %B ITC %D 1982 %I IEEE Computer Society %K dblp %P 609-614 %T ECL Board Testing: An In-Circuit Point of View. %U http://dblp.uni-trier.de/db/conf/itc/itc1982.html#Crosby82

@inproceedings{conf/itc/Crosby82, added-at = {2002-10-23T00:00:00.000+0200}, author = {Crosby, Brian C.}, biburl = {https://www.bibsonomy.org/bibtex/2fe2c16619a6594cd485a465c99f6d2b7/dblp}, booktitle = {ITC}, crossref = {conf/itc/1982}, date = {2002-10-23}, description = {dblp}, interhash = {4268121872441f6b7aecbdf72481becf}, intrahash = {fe2c16619a6594cd485a465c99f6d2b7}, keywords = {dblp}, pages = {609-614}, publisher = {IEEE Computer Society}, timestamp = {2002-10-23T00:00:00.000+0200}, title = {ECL Board Testing: An In-Circuit Point of View.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1982.html#Crosby82}, year = 1982 }