%0 Conference Paper %1 conf/case/ChangLJ05 %A Chang, Chuan-Yu %A Lin, Si-Yan %A Jeng, MuDer %B CASE %D 2005 %I IEEE %K dblp %P 301-306 %T Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection. %U http://dblp.uni-trier.de/db/conf/case/case2005.html#ChangLJ05 %@ 0-7803-9425-9

@inproceedings{conf/case/ChangLJ05, added-at = {2017-05-25T00:00:00.000+0200}, author = {Chang, Chuan-Yu and Lin, Si-Yan and Jeng, MuDer}, biburl = {https://www.bibsonomy.org/bibtex/26b8d41004babe57b9ff7cfb94866cccb/dblp}, booktitle = {CASE}, crossref = {conf/case/2005}, ee = {https://doi.org/10.1109/COASE.2005.1506786}, interhash = {45cb86609a3bcbbbd7c8f09ec07dd1a2}, intrahash = {6b8d41004babe57b9ff7cfb94866cccb}, isbn = {0-7803-9425-9}, keywords = {dblp}, pages = {301-306}, publisher = {IEEE}, timestamp = {2019-10-17T21:17:22.000+0200}, title = {Using a two-layer competitive Hopfield neural network for semiconductor wafer defect detection.}, url = {http://dblp.uni-trier.de/db/conf/case/case2005.html#ChangLJ05}, year = 2005 }