%0 Conference Paper %1 conf/irps/TangCJBTWWM15 %A Tang, Baojun %A Croes, Kris %A Jourdan, Nicolas %A Bömmels, Jürgen %A Tökei, Zsolt %A Wolf, Ingrid De %A Wilcox, Eric %A McMullen, Timothy %B IRPS %D 2015 %I IEEE %K dblp %P 2 %T Constant voltage electromigration for advanced BEOL copper interconnects. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TangCJBTWWM15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/TangCJBTWWM15, added-at = {2024-10-23T00:00:00.000+0200}, author = {Tang, Baojun and Croes, Kris and Jourdan, Nicolas and Bömmels, Jürgen and Tökei, Zsolt and Wolf, Ingrid De and Wilcox, Eric and McMullen, Timothy}, biburl = {https://www.bibsonomy.org/bibtex/2c1b640cba91dbf538464ea0e6de9c1cc/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112685}, interhash = {4dc41e86603542cb5c3406d52e5d27a9}, intrahash = {c1b640cba91dbf538464ea0e6de9c1cc}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 2, publisher = {IEEE}, timestamp = {2024-10-28T07:25:51.000+0100}, title = {Constant voltage electromigration for advanced BEOL copper interconnects.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#TangCJBTWWM15}, year = 2015 }