%0 Conference Paper %1 conf/ats/BhuniaLR02 %A Bhunia, Swarup %A Li, Hai %A Roy, Kaushik %B Asian Test Symposium %D 2002 %I IEEE Computer Society %K %P 157- %T A High Performance IDDQ Testable Cache for Scaled CMOS Technologies. %U http://dblp.uni-trier.de/db/conf/ats/ats2002.html#BhuniaLR02 %@ 0-7695-1825-7

@inproceedings{conf/ats/BhuniaLR02, added-at = {2023-12-12T22:51:13.000+0100}, author = {Bhunia, Swarup and Li, Hai and Roy, Kaushik}, biburl = {https://www.bibsonomy.org/bibtex/28bda24480644255d50164b545bce61cb/admin}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2002}, ee = {http://doi.ieeecomputersociety.org/10.1109/ATS.2002.1181704}, interhash = {4ee5a06043d48b0327458433b0c7a0e0}, intrahash = {8bda24480644255d50164b545bce61cb}, isbn = {0-7695-1825-7}, keywords = {}, pages = {157-}, publisher = {IEEE Computer Society}, timestamp = {2023-12-12T22:51:13.000+0100}, title = {A High Performance IDDQ Testable Cache for Scaled CMOS Technologies.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2002.html#BhuniaLR02}, year = 2002 }