%0 Journal Article %1 journals/eswa/ZhangJL21 %A Zhang, Huan %A Jiang, Liangxiao %A Li, Chaoqun %D 2021 %J Expert Syst. Appl. %K dblp %P 115673 %T CS-ResNet: Cost-sensitive residual convolutional neural network for PCB cosmetic defect detection. %U http://dblp.uni-trier.de/db/journals/eswa/eswa185.html#ZhangJL21 %V 185

@article{journals/eswa/ZhangJL21, added-at = {2022-12-20T00:00:00.000+0100}, author = {Zhang, Huan and Jiang, Liangxiao and Li, Chaoqun}, biburl = {https://www.bibsonomy.org/bibtex/21b103eceaf1507708fca9c21931b9fdc/dblp}, ee = {https://doi.org/10.1016/j.eswa.2021.115673}, interhash = {51a2254cc312dae7272b7d169b210dce}, intrahash = {1b103eceaf1507708fca9c21931b9fdc}, journal = {Expert Syst. Appl.}, keywords = {dblp}, pages = 115673, timestamp = {2024-04-08T10:06:46.000+0200}, title = {CS-ResNet: Cost-sensitive residual convolutional neural network for PCB cosmetic defect detection.}, url = {http://dblp.uni-trier.de/db/journals/eswa/eswa185.html#ZhangJL21}, volume = 185, year = 2021 }