%0 Journal Article %1 10.2307/23982822 %A Feser, Hans-Dieter %A Lärm, Thomas %D 1982 %I Nomos Verlagsgesellschaft mbH %J Leviathan %K test %N 4 %P 531-554 %T Strukturelle Arbeitslosigkeit, technologischer Wandel und der Einfluß der Mikroelektronik %U http://www.jstor.org/stable/23982822 %V 10

@article{10.2307/23982822, added-at = {2016-12-07T10:37:32.000+0100}, author = {Feser, Hans-Dieter and Lärm, Thomas}, biburl = {https://www.bibsonomy.org/bibtex/2225ae054fe97e2330cc93a9b01b25913/marius02}, interhash = {52a578c5e5f4dd4420f297bb7ca6969d}, intrahash = {225ae054fe97e2330cc93a9b01b25913}, issn = {03400425, 18618588}, journal = {Leviathan}, keywords = {test}, number = 4, pages = {531-554}, publisher = {Nomos Verlagsgesellschaft mbH}, timestamp = {2016-12-07T10:37:32.000+0100}, title = {Strukturelle Arbeitslosigkeit, technologischer Wandel und der Einfluß der Mikroelektronik}, url = {http://www.jstor.org/stable/23982822}, volume = 10, year = 1982 }