%0 Journal Article %1 journals/mj/KumariRPS21 %A Kumari, Pallavi %A Raj, Anand %A Priyadarshani, Kumari Nibha %A Singh, Sangeeta %D 2021 %J Microelectron. J. %K dblp %P 105077 %T Impact of temperature and interface trapped charges variation on the Analog/RF and linearity of vertically extended drain double gate Si0.5Ge0.5 source tunnel FET. %U http://dblp.uni-trier.de/db/journals/mj/mj113.html#KumariRPS21 %V 113

@article{journals/mj/KumariRPS21, added-at = {2021-10-14T00:00:00.000+0200}, author = {Kumari, Pallavi and Raj, Anand and Priyadarshani, Kumari Nibha and Singh, Sangeeta}, biburl = {https://www.bibsonomy.org/bibtex/24f7d397b20d5932cb24bf5eb87add89d/dblp}, ee = {https://doi.org/10.1016/j.mejo.2021.105077}, interhash = {5488463b468334c22810ae3190ab6a6a}, intrahash = {4f7d397b20d5932cb24bf5eb87add89d}, journal = {Microelectron. J.}, keywords = {dblp}, pages = 105077, timestamp = {2024-04-08T21:36:20.000+0200}, title = {Impact of temperature and interface trapped charges variation on the Analog/RF and linearity of vertically extended drain double gate Si0.5Ge0.5 source tunnel FET.}, url = {http://dblp.uni-trier.de/db/journals/mj/mj113.html#KumariRPS21}, volume = 113, year = 2021 }