%0 Journal Article %1 akerman:1870 %A Akerman, B. %A Escudero, R. %A Leighton, C. %A Kim, S. %A Schuller, Ivan K. %A Rabson, D. A. %D 2000 %I AIP %J Applied Physics Letters %K mtj %N 12 %P 1870-1872 %R 10.1063/1.1310633 %T Reliability of normal-state current--voltage characteristics as an indicator of tunnel-junction barrier quality %U http://link.aip.org/link/?APL/77/1870/1 %V 77

@article{akerman:1870, added-at = {2008-08-05T20:12:22.000+0200}, author = {Akerman, B. and Escudero, R. and Leighton, C. and Kim, S. and Schuller, Ivan K. and Rabson, D. A.}, biburl = {https://www.bibsonomy.org/bibtex/231bb5e79f5215058c0fd1e7a8cb10631/srd27}, doi = {10.1063/1.1310633}, interhash = {5786a6a1eee3ea5b10058142ac4dbf16}, intrahash = {31bb5e79f5215058c0fd1e7a8cb10631}, journal = {Applied Physics Letters}, keywords = {mtj}, number = 12, pages = {1870-1872}, publisher = {AIP}, timestamp = {2008-08-05T20:12:22.000+0200}, title = {Reliability of normal-state current--voltage characteristics as an indicator of tunnel-junction barrier quality}, url = {http://link.aip.org/link/?APL/77/1870/1}, volume = 77, year = 2000 }