%0 Conference Paper %1 conf/itc/HapkeM18 %A Hapke, Friedrich %A Maxwell, Peter C. %B ITC %D 2018 %I IEEE %K dblp %P 1-10 %T Total Critical Area Based Testing. %U http://dblp.uni-trier.de/db/conf/itc/itc2018.html#HapkeM18 %@ 978-1-5386-8382-8

@inproceedings{conf/itc/HapkeM18, added-at = {2019-01-26T00:00:00.000+0100}, author = {Hapke, Friedrich and Maxwell, Peter C.}, biburl = {https://www.bibsonomy.org/bibtex/29b5277bcaef8e74088234313335bd463/dblp}, booktitle = {ITC}, crossref = {conf/itc/2018}, ee = {https://doi.org/10.1109/TEST.2018.8624825}, interhash = {5b00b1bf66012c389e964bf8d820d24c}, intrahash = {9b5277bcaef8e74088234313335bd463}, isbn = {978-1-5386-8382-8}, keywords = {dblp}, pages = {1-10}, publisher = {IEEE}, timestamp = {2019-01-29T11:41:03.000+0100}, title = {Total Critical Area Based Testing.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2018.html#HapkeM18}, year = 2018 }