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- BibTeX key
- conf/itc/SuHWHKCW04
- entry type
- inproceedings
- booktitle
- ITC
- year
- 2004
- pages
- 124-133
- publisher
- IEEE Computer Society
- crossref
- conf/itc/2004
- ee
- https://doi.ieeecomputersociety.org/10.1109/ITC.2004.123
- isbn
- 0-7803-8581-0
- url
- http://dblp.uni-trier.de/db/conf/itc/itc2004.html#SuHWHKCW04
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- please select -%0 Conference Paper
%1 conf/itc/SuHWHKCW04
%A Su, Chin-Lung
%A Huang, Rei-Fu
%A Wu, Cheng-Wen
%A Hung, Chien-Chung
%A Kao, Ming-Jer
%A Chang, Yeong-Jar
%A Wu, Wen Ching
%B ITC
%D 2004
%I IEEE Computer Society
%K dblp
%P 124-133
%T MRAM Defect Analysis and Fault Modeli.
%U http://dblp.uni-trier.de/db/conf/itc/itc2004.html#SuHWHKCW04
%@ 0-7803-8581-0
@inproceedings{conf/itc/SuHWHKCW04,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Su, Chin-Lung and Huang, Rei-Fu and Wu, Cheng-Wen and Hung, Chien-Chung and Kao, Ming-Jer and Chang, Yeong-Jar and Wu, Wen Ching},
biburl = {https://www.bibsonomy.org/bibtex/2e639d7e6c25843957f52daf8477d52d1/dblp},
booktitle = {ITC},
crossref = {conf/itc/2004},
ee = {https://doi.ieeecomputersociety.org/10.1109/ITC.2004.123},
interhash = {5c2ccf712cad9953e3dd4d99faa9a66b},
intrahash = {e639d7e6c25843957f52daf8477d52d1},
isbn = {0-7803-8581-0},
keywords = {dblp},
pages = {124-133},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:27:43.000+0200},
title = {MRAM Defect Analysis and Fault Modeli.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2004.html#SuHWHKCW04},
year = 2004
}