Inproceedings,
Stress Testing for Resilience of Semiconductor Supply Chains.
Z. Collier, D. Loose, E. Sellers, T. Polmateer, M. Behl, I. Linkov, and J. Lambert.UEMCON, page 42-49. IEEE, (2023)
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- conf/uemcom/CollierLSPBLL23
- entry type
- inproceedings
- booktitle
- UEMCON
- year
- 2023
- pages
- 42-49
- publisher
- IEEE
- crossref
- conf/uemcom/2023
- ee
- https://doi.org/10.1109/UEMCON59035.2023.10315988
- isbn
- 979-8-3503-0413-8
- url
- http://dblp.uni-trier.de/db/conf/uemcom/uemcom2023.html#CollierLSPBLL23
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- please select -%0 Conference Paper
%1 conf/uemcom/CollierLSPBLL23
%A Collier, Zachary A.
%A Loose, Davis C.
%A Sellers, Elvie
%A Polmateer, Thomas L.
%A Behl, Madhur
%A Linkov, Igor
%A Lambert, James H.
%B UEMCON
%D 2023
%E Chakrabarti, Satyajit
%E Paul, Rajashree
%I IEEE
%K dblp
%P 42-49
%T Stress Testing for Resilience of Semiconductor Supply Chains.
%U http://dblp.uni-trier.de/db/conf/uemcom/uemcom2023.html#CollierLSPBLL23
%@ 979-8-3503-0413-8
@inproceedings{conf/uemcom/CollierLSPBLL23,
added-at = {2023-11-24T00:00:00.000+0100},
author = {Collier, Zachary A. and Loose, Davis C. and Sellers, Elvie and Polmateer, Thomas L. and Behl, Madhur and Linkov, Igor and Lambert, James H.},
biburl = {https://www.bibsonomy.org/bibtex/22ef6cfa5dd4df7630533cd917cbcd8d5/dblp},
booktitle = {UEMCON},
crossref = {conf/uemcom/2023},
editor = {Chakrabarti, Satyajit and Paul, Rajashree},
ee = {https://doi.org/10.1109/UEMCON59035.2023.10315988},
interhash = {5c4c5e2fd8d18ea03689c7839c265764},
intrahash = {2ef6cfa5dd4df7630533cd917cbcd8d5},
isbn = {979-8-3503-0413-8},
keywords = {dblp},
pages = {42-49},
publisher = {IEEE},
timestamp = {2024-04-10T01:39:53.000+0200},
title = {Stress Testing for Resilience of Semiconductor Supply Chains.},
url = {http://dblp.uni-trier.de/db/conf/uemcom/uemcom2023.html#CollierLSPBLL23},
year = 2023
}