%0 Conference Paper %1 conf/dft/BaxterM95 %A Baxter, M. %A Muir, D. %B DFT %D 1995 %I IEEE Computer Society %K dblp %P 164-172 %T Using defect density modelling to drive the optimisation of circuit layout, maximising yield. %U http://dblp.uni-trier.de/db/conf/dft/dft1995.html#BaxterM95 %@ 0-8186-7107-6

@inproceedings{conf/dft/BaxterM95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Baxter, M. and Muir, D.}, biburl = {https://www.bibsonomy.org/bibtex/230a430f15f71b86c4fa247b381ed18b8/dblp}, booktitle = {DFT}, crossref = {conf/dft/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/DFTVS.1995.476949}, interhash = {61d056f504e79f999461f7491f2664ad}, intrahash = {30a430f15f71b86c4fa247b381ed18b8}, isbn = {0-8186-7107-6}, keywords = {dblp}, pages = {164-172}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T20:00:51.000+0200}, title = {Using defect density modelling to drive the optimisation of circuit layout, maximising yield.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft1995.html#BaxterM95}, year = 1995 }