Teil eines Buches,
Low Temperature Scanning Probe Microscopy
Springer Handbook of Nanotechnology, Springer Berlin Heidelberg, (2004)
DOI: 10.1007/3-540-29838-X_14
Zusammenfassung
This chapter is dedicated to scanning probe microscopy, one of the most important techniques in nanotechnology. In general, scanning probe techniques allow the measurement of physical properties down to the nanometer scale. Some techniques, such as the scanning tunneling microscope and the scanning force microscope even go down to the atomic scale. The properties that are accessible are various. Most importantly, one can image the arrangement of atoms on conducting surfaces by scanning tunneling microscopy and on insulating substrates by scanning force microscopy. But also the arrangement of electrons (scanning tunneling spectroscopy), the force interaction between different atoms (scanning force spectroscopy), magnetic domains (magnetic force microscopy), the local capacitance (scanning capacitance microscopy), the local temperature (scanning thermo microscopy), and local light-induced excitations (scanning near-field microscopy) can be measured with high spatial resolution. In addition, some techniques even allow the manipulation of atomic configurations.
