%0 Journal Article %1 journals/access/OkaISKIAFM23 %A Oka, Hiroshi %A Inaba, Takumi %A Shitakata, Shunsuke %A Kato, Kimihiko %A Iizuka, Shota %A Asai, Hidehiro %A Fuketa, Hiroshi %A Mori, Takahiro %D 2023 %J IEEE Access %K dblp %P 121567-121573 %T Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality. %U http://dblp.uni-trier.de/db/journals/access/access11.html#OkaISKIAFM23 %V 11

@article{journals/access/OkaISKIAFM23, added-at = {2023-11-13T00:00:00.000+0100}, author = {Oka, Hiroshi and Inaba, Takumi and Shitakata, Shunsuke and Kato, Kimihiko and Iizuka, Shota and Asai, Hidehiro and Fuketa, Hiroshi and Mori, Takahiro}, biburl = {https://www.bibsonomy.org/bibtex/2865d8171d36f015e69768adceb39473c/dblp}, ee = {https://doi.org/10.1109/ACCESS.2023.3327731}, interhash = {6564f8a7a739deecfbac77be09430800}, intrahash = {865d8171d36f015e69768adceb39473c}, journal = {IEEE Access}, keywords = {dblp}, pages = {121567-121573}, timestamp = {2024-04-08T14:02:16.000+0200}, title = {Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality.}, url = {http://dblp.uni-trier.de/db/journals/access/access11.html#OkaISKIAFM23}, volume = 11, year = 2023 }