%0 Conference Paper %1 conf/date/Ye0NKX20 %A Ye, Min %A Li, Qiao %A Nie, Jianqiang %A Kuo, Tei-Wei %A Xue, Chun Jason %B DATE %D 2020 %I IEEE %K dblp %P 109-114 %T Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory. %U http://dblp.uni-trier.de/db/conf/date/date2020.html#Ye0NKX20 %@ 978-3-9819263-4-7

@inproceedings{conf/date/Ye0NKX20, added-at = {2020-09-05T00:00:00.000+0200}, author = {Ye, Min and Li, Qiao and Nie, Jianqiang and Kuo, Tei-Wei and Xue, Chun Jason}, biburl = {https://www.bibsonomy.org/bibtex/255f842bdb5cf8a24544e755ab0c53be6/dblp}, booktitle = {DATE}, crossref = {conf/date/2020}, ee = {https://doi.org/10.23919/DATE48585.2020.9116337}, interhash = {67f2e328ab092923899cca542933f412}, intrahash = {55f842bdb5cf8a24544e755ab0c53be6}, isbn = {978-3-9819263-4-7}, keywords = {dblp}, pages = {109-114}, publisher = {IEEE}, timestamp = {2020-09-09T14:26:17.000+0200}, title = {Valid Window: A New Metric to Measure the Reliability of NAND Flash Memory.}, url = {http://dblp.uni-trier.de/db/conf/date/date2020.html#Ye0NKX20}, year = 2020 }