%0 Conference Paper %1 conf/irps/ToprasertpongNMCCSNTT24 %A Toprasertpong, Kasidit %A Nako, Eishin %A Min, Shin-Yi %A Cai, Zuocheng %A Cho, Seong-Kun %A Suzuki, Rikuo %A Nakane, Ryosho %A Takenaka, Mitsuru %A Takagi, Shinichi %B IRPS %D 2024 %I IEEE %K dblp %P 1-6 %T Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited). %U http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ToprasertpongNMCCSNTT24 %@ 979-8-3503-6976-2

@inproceedings{conf/irps/ToprasertpongNMCCSNTT24, added-at = {2024-05-29T00:00:00.000+0200}, author = {Toprasertpong, Kasidit and Nako, Eishin and Min, Shin-Yi and Cai, Zuocheng and Cho, Seong-Kun and Suzuki, Rikuo and Nakane, Ryosho and Takenaka, Mitsuru and Takagi, Shinichi}, biburl = {https://www.bibsonomy.org/bibtex/262db4353060df959626d7d5398c96854/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2024}, ee = {https://doi.org/10.1109/IRPS48228.2024.10529344}, interhash = {6864677407e766a7f3efb3cfec700e60}, intrahash = {62db4353060df959626d7d5398c96854}, isbn = {979-8-3503-6976-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-06-03T07:16:33.000+0200}, title = {Robustness to Device Degradation in Silicon FeFET-based Reservoir Computing (Invited).}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2024.html#ToprasertpongNMCCSNTT24}, year = 2024 }