%0 Conference Paper %1 conf/ats/OnoWHNY97 %A Ono, Toshinobu %A Wakui, Kazuo %A Hikima, Hitoshi %A Nakamura, Yoshiyuki %A Yoshida, Masaaki %B Asian Test Symposium %D 1997 %I IEEE Computer Society %K dblp %P 122-125 %T Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs. %U http://dblp.uni-trier.de/db/conf/ats/ats1997.html#OnoWHNY97 %@ 0-8186-8209-4

@inproceedings{conf/ats/OnoWHNY97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Ono, Toshinobu and Wakui, Kazuo and Hikima, Hitoshi and Nakamura, Yoshiyuki and Yoshida, Masaaki}, biburl = {https://www.bibsonomy.org/bibtex/256a06cad25daec87b04823d8ca3f885d/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1997.643946}, interhash = {6fc0ce0729e50f5f4ad9ac62b1b84861}, intrahash = {56a06cad25daec87b04823d8ca3f885d}, isbn = {0-8186-8209-4}, keywords = {dblp}, pages = {122-125}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:16.000+0200}, title = {Integrated and Automated Design-for-Testability Implementation for Cell-Based ICs.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1997.html#OnoWHNY97}, year = 1997 }