%0 Conference Paper %1 conf/ats/YamadaYM95 %A Yamada, Teruhiko %A Yamazaki, Koji %A McCluskey, Edward J. %B Asian Test Symposium %D 1995 %I IEEE Computer Society %K dblp %P 65-70 %T A simple technique for locating gate-level faults in combinational circuits. %U http://dblp.uni-trier.de/db/conf/ats/ats1995.html#YamadaYM95 %@ 0-8186-7129-7

@inproceedings{conf/ats/YamadaYM95, added-at = {2023-03-24T00:00:00.000+0100}, author = {Yamada, Teruhiko and Yamazaki, Koji and McCluskey, Edward J.}, biburl = {https://www.bibsonomy.org/bibtex/22edcca54a581fd670764337dff6669c2/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1995}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1995.485318}, interhash = {70503c25bb9d011309c79d5bc840751f}, intrahash = {2edcca54a581fd670764337dff6669c2}, isbn = {0-8186-7129-7}, keywords = {dblp}, pages = {65-70}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:35:47.000+0200}, title = {A simple technique for locating gate-level faults in combinational circuits.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1995.html#YamadaYM95}, year = 1995 }