Inproceedings,
Test-Plan Optimization for Flying-Probes In-Circuit Testers.
L. Bonaria, M. Raganato, G. Squillero, and M. Reorda.ITC-Asia, page 19-24. IEEE, (2019)
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- BibTeX key
- conf/itc-asia/BonariaRSR19
- entry type
- inproceedings
- booktitle
- ITC-Asia
- year
- 2019
- pages
- 19-24
- publisher
- IEEE
- crossref
- conf/itc-asia/2019
- ee
- https://doi.org/10.1109/ITC-Asia.2019.00017
- isbn
- 978-1-7281-4718-5
- url
- http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2019.html#BonariaRSR19
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%1 conf/itc-asia/BonariaRSR19
%A Bonaria, Luciano
%A Raganato, Maurizio
%A Squillero, Giovanni
%A Reorda, Matteo Sonza
%B ITC-Asia
%D 2019
%I IEEE
%K dblp
%P 19-24
%T Test-Plan Optimization for Flying-Probes In-Circuit Testers.
%U http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2019.html#BonariaRSR19
%@ 978-1-7281-4718-5
@inproceedings{conf/itc-asia/BonariaRSR19,
added-at = {2019-11-12T00:00:00.000+0100},
author = {Bonaria, Luciano and Raganato, Maurizio and Squillero, Giovanni and Reorda, Matteo Sonza},
biburl = {https://www.bibsonomy.org/bibtex/290a78cb04b561e3b80c1eb9b633b3d9c/dblp},
booktitle = {ITC-Asia},
crossref = {conf/itc-asia/2019},
ee = {https://doi.org/10.1109/ITC-Asia.2019.00017},
interhash = {729449389e17a88033ab463a9dba7fae},
intrahash = {90a78cb04b561e3b80c1eb9b633b3d9c},
isbn = {978-1-7281-4718-5},
keywords = {dblp},
pages = {19-24},
publisher = {IEEE},
timestamp = {2019-11-13T11:39:37.000+0100},
title = {Test-Plan Optimization for Flying-Probes In-Circuit Testers.},
url = {http://dblp.uni-trier.de/db/conf/itc-asia/itc-asia2019.html#BonariaRSR19},
year = 2019
}