%0 Conference Paper %1 conf/ats/HosokawaHIF99 %A Hosokawa, Toshinori %A Hiraoka, Toshihiro %A Inoue, Tomoo %A Fujiwara, Hideo %B Asian Test Symposium %D 1999 %I IEEE Computer Society %K dblp %P 192- %T Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model. %U http://dblp.uni-trier.de/db/conf/ats/ats1999.html#HosokawaHIF99 %@ 0-7695-0315-2

@inproceedings{conf/ats/HosokawaHIF99, added-at = {2023-03-24T00:00:00.000+0100}, author = {Hosokawa, Toshinori and Hiraoka, Toshihiro and Inoue, Tomoo and Fujiwara, Hideo}, biburl = {https://www.bibsonomy.org/bibtex/23c7846fbfc64769d2e495eb0be967cdd/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/1999}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.1999.810750}, interhash = {7434b5b1bdfb3b21c6df7469dd6a7003}, intrahash = {3c7846fbfc64769d2e495eb0be967cdd}, isbn = {0-7695-0315-2}, keywords = {dblp}, pages = {192-}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:36:07.000+0200}, title = {Static and Dynamic Test Sequence Compaction Methods for Acyclic Sequential Circuits Using a Time Expansion Model.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats1999.html#HosokawaHIF99}, year = 1999 }