%0 Conference Paper %1 conf/embc/OrtizBK20 %A Ortiz, Oscar %A Blustein, Daniel H. %A Kuruganti, Usha %B EMBC %D 2020 %I IEEE %K dblp %P 2885-2888 %T Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive Load Using a Wireless Dry-Electrode System. %U http://dblp.uni-trier.de/db/conf/embc/embc2020.html#OrtizBK20 %@ 978-1-7281-1990-8

@inproceedings{conf/embc/OrtizBK20, added-at = {2021-09-27T00:00:00.000+0200}, author = {Ortiz, Oscar and Blustein, Daniel H. and Kuruganti, Usha}, biburl = {https://www.bibsonomy.org/bibtex/2d8028c9cec4616a3ca027a9857c0972a/dblp}, booktitle = {EMBC}, crossref = {conf/embc/2020}, ee = {https://www.wikidata.org/entity/Q100448044}, interhash = {74c45ef5b0299f37d64b941a5db2e39c}, intrahash = {d8028c9cec4616a3ca027a9857c0972a}, isbn = {978-1-7281-1990-8}, keywords = {dblp}, pages = {2885-2888}, publisher = {IEEE}, timestamp = {2024-04-10T03:58:54.000+0200}, title = {Test-Retest Reliability of Time-Domain EEG Features to Assess Cognitive Load Using a Wireless Dry-Electrode System.}, url = {http://dblp.uni-trier.de/db/conf/embc/embc2020.html#OrtizBK20}, year = 2020 }