%0 Conference Paper %1 conf/ats/WangAHTIMM18 %A Wang, Senling %A Aono, Tomoki %A Higami, Yoshinobu %A Takahashi, Hiroshi %A Iwata, Hiroyuki %A Maeda, Yoichi %A Matsushima, Jun %B ATS %D 2018 %I IEEE %K dblp %P 155-160 %T Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST. %U http://dblp.uni-trier.de/db/conf/ats/ats2018.html#WangAHTIMM18 %@ 978-1-5386-9466-4

@inproceedings{conf/ats/WangAHTIMM18, added-at = {2023-03-24T00:00:00.000+0100}, author = {Wang, Senling and Aono, Tomoki and Higami, Yoshinobu and Takahashi, Hiroshi and Iwata, Hiroyuki and Maeda, Yoichi and Matsushima, Jun}, biburl = {https://www.bibsonomy.org/bibtex/272a76aa9700a852495566cea8735481a/dblp}, booktitle = {ATS}, crossref = {conf/ats/2018}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2018.00038}, interhash = {75256e4a39ee214214cea98b805ab612}, intrahash = {72a76aa9700a852495566cea8735481a}, isbn = {978-1-5386-9466-4}, keywords = {dblp}, pages = {155-160}, publisher = {IEEE}, timestamp = {2024-04-10T06:36:39.000+0200}, title = {Capture-Pattern-Control to Address the Fault Detection Degradation Problem of Multi-cycle Test in Logic BIST.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2018.html#WangAHTIMM18}, year = 2018 }