%0 Journal Article %1 journals/access/KiniDMSHTK20 %A Kini, Roshan L. %A Dhakal, Shankar %A Mahmud, Sadab %A Sellers, Andrew J. %A Hontz, Michael R. %A Tine, Cheikh A. %A Khanna, Raghav %D 2020 %J IEEE Access %K dblp %P 137312-137321 %T An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs. %U http://dblp.uni-trier.de/db/journals/access/access8.html#KiniDMSHTK20 %V 8

@article{journals/access/KiniDMSHTK20, added-at = {2023-09-30T00:00:00.000+0200}, author = {Kini, Roshan L. and Dhakal, Shankar and Mahmud, Sadab and Sellers, Andrew J. and Hontz, Michael R. and Tine, Cheikh A. and Khanna, Raghav}, biburl = {https://www.bibsonomy.org/bibtex/2334fc366796159c477153203d364a467/dblp}, ee = {https://doi.org/10.1109/ACCESS.2020.3011453}, interhash = {754b58179427420c7a3c3f735d108c6e}, intrahash = {334fc366796159c477153203d364a467}, journal = {IEEE Access}, keywords = {dblp}, pages = {137312-137321}, timestamp = {2024-04-08T14:11:59.000+0200}, title = {An Investigation of Frequency Dependent Reliability and Failure Mechanism of pGaN Gated GaN HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/access/access8.html#KiniDMSHTK20}, volume = 8, year = 2020 }