%0 Journal Article %1 Burger1986 %A Burger, Dale R. %D 1986 %J USPTO %K contact resistance %T Method for contact resistivity measurements on photovoltaic cells and cell adapted for such measurement %U http://www.google.com/patents?id=EJ89AAAAEBAJ&dq=4628144 %X A method is disclosed for scribing at least three grid contacts of a photovoltaic cell to electrically isolate them from the grid contact pattern used to collect solar current generated by the cell, and using the scribed segments for determining parameters of the cell by a combination of contact end resistance (CER) measurements using a minimum of three equally or unequally spaced lines, and transmission line modal (TLM) measurements using a minimum of four unequally spaced lines. TLM measurements may be used to determine sheet resistance under the contact, R.sub.sk, while CER measurements are used to determine contact resistivity, .rho..sub.c, from a nomograph of contact resistivity as a function of contact end resistance and sheet resistivity under the contact. In some cases, such as the case of silicon photovoltaic cells, sheet resistivity under the contact may be assumed to be equal to the known sheet resistance, R.sub.s, of the semiconductor material, thereby obviating... Patent number: 4628144 Filing date: Jun 7, 1983 Issue date: Dec 9, 1986 Inventor: Dale R. Burger Assignee: California Institute of Technology U.S. Classification 136/256; 29574; 136/290; 324/64; 357/68 International Classification H01L 3104; G01R 2714

@article{Burger1986, abstract = {A method is disclosed for scribing at least three grid contacts of a photovoltaic cell to electrically isolate them from the grid contact pattern used to collect solar current generated by the cell, and using the scribed segments for determining parameters of the cell by a combination of contact end resistance (CER) measurements using a minimum of three equally or unequally spaced lines, and transmission line modal (TLM) measurements using a minimum of four unequally spaced lines. TLM measurements may be used to determine sheet resistance under the contact, R.sub.sk, while CER measurements are used to determine contact resistivity, .rho..sub.c, from a nomograph of contact resistivity as a function of contact end resistance and sheet resistivity under the contact. In some cases, such as the case of silicon photovoltaic cells, sheet resistivity under the contact may be assumed to be equal to the known sheet resistance, R.sub.s, of the semiconductor material, thereby obviating... Patent number: 4628144 Filing date: Jun 7, 1983 Issue date: Dec 9, 1986 Inventor: Dale R. Burger Assignee: California Institute of Technology U.S. Classification 136/256; 29574; 136/290; 324/64; 357/68 International Classification H01L 3104; G01R 2714}, added-at = {2011-09-01T13:26:03.000+0200}, author = {Burger, Dale R.}, biburl = {https://www.bibsonomy.org/bibtex/27afc9d14a57fbf4471a79a7854be8541/procomun}, file = {Burger1986.pdf:Burger1986.pdf:PDF}, interhash = {7e7954e6255e8577098ca84b2ee3069c}, intrahash = {7afc9d14a57fbf4471a79a7854be8541}, journal = {USPTO}, keywords = {contact resistance}, owner = {oscar}, refid = {Burger1986}, timestamp = {2011-09-02T08:25:25.000+0200}, title = {Method for contact resistivity measurements on photovoltaic cells and cell adapted for such measurement}, url = {http://www.google.com/patents?id=EJ89AAAAEBAJ&dq=4628144}, year = 1986 }