%0 Conference Paper %1 conf/ifip5-7/ChenLC18 %A Chen, Yi-Jyun %A Lee, Yen-Han %A Chiu, Ming-Chuan %B APMS (2) %D 2018 %E Moon, Ilkyeong %E Lee, Gyu M. %E Park, Jinwoo %E Kiritsis, Dimitris %E von Cieminski, Gregor %I Springer %K dblp %P 394-401 %T Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry. %U http://dblp.uni-trier.de/db/conf/ifip5-7/apms2018-2.html#ChenLC18 %V 536 %@ 978-3-319-99707-0

@inproceedings{conf/ifip5-7/ChenLC18, added-at = {2018-08-27T00:00:00.000+0200}, author = {Chen, Yi-Jyun and Lee, Yen-Han and Chiu, Ming-Chuan}, biburl = {https://www.bibsonomy.org/bibtex/2a1b792259d57058b4474265edf079900/dblp}, booktitle = {APMS (2)}, crossref = {conf/ifip5-7/2018apms2}, editor = {Moon, Ilkyeong and Lee, Gyu M. and Park, Jinwoo and Kiritsis, Dimitris and von Cieminski, Gregor}, ee = {https://doi.org/10.1007/978-3-319-99707-0_49}, interhash = {84afa47351c23f95b0b441a05bb007e4}, intrahash = {a1b792259d57058b4474265edf079900}, isbn = {978-3-319-99707-0}, keywords = {dblp}, pages = {394-401}, publisher = {Springer}, series = {IFIP Advances in Information and Communication Technology}, timestamp = {2018-08-28T11:38:02.000+0200}, title = {Construct an Intelligent Yield Alert and Diagnostic Analysis System via Data Analysis: Empirical Study of a Semiconductor Foundry.}, url = {http://dblp.uni-trier.de/db/conf/ifip5-7/apms2018-2.html#ChenLC18}, volume = 536, year = 2018 }