%0 Conference Paper %1 conf/iccd/PatilR89 %A Patil, Srinivas %A Reddy, Sudhakar M. %B ICCD %D 1989 %I IEEE %K dblp %P 40-43 %T A test generation system for path delay faults. %U http://dblp.uni-trier.de/db/conf/iccd/iccd1989.html#PatilR89 %@ 0-8186-1971-6

@inproceedings{conf/iccd/PatilR89, added-at = {2021-07-28T00:00:00.000+0200}, author = {Patil, Srinivas and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/2511e251fba48944d771893aefe7bba99/dblp}, booktitle = {ICCD}, crossref = {conf/iccd/1989}, ee = {https://doi.org/10.1109/ICCD.1989.63324}, interhash = {86622b40de9bebe0ab6058e8dc4cffd8}, intrahash = {511e251fba48944d771893aefe7bba99}, isbn = {0-8186-1971-6}, keywords = {dblp}, pages = {40-43}, publisher = {IEEE}, timestamp = {2024-04-09T21:17:44.000+0200}, title = {A test generation system for path delay faults.}, url = {http://dblp.uni-trier.de/db/conf/iccd/iccd1989.html#PatilR89}, year = 1989 }