Article,

Optical microscopy of single ions and morphological inhomogeneities in Sm-doped CaF2 thin films

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Phys. Rev. B, 62 (16): 11163-11169 (Oct 15, 2000)
DOI: 10.1103/PhysRevB.62.11163

Abstract

We have investigated the luminescence of CaF2 thin films doped with very low concentrations of Sm2+ ions using scanning confocal optical microscopy at low temperatures. The film morphology was studied independently by atomic force microscopy. The Sm2+ ions are homogeneously distributed in the films and show photobleaching. Unexpectedly, on the film surface strongly luminescent small topographic features are observed that are found to contain Sm3+ by spectral analysis. The formation of Sm3+ is probably due to the presence of oxygen during film growth. In the lowest doped films on-off blinking behavior of isolated luminescent spots provides strong evidence for the first observation of single ions in a crystal.

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