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%0 Conference Paper
%1 conf/itc/KimeKLW84
%A Kime, Charles R.
%A Kwan, H. H.
%A Lemke, J. K.
%A Williams, Gerald B.
%B ITC
%D 1984
%I IEEE Computer Society
%K dblp
%P 327-337
%T A Built-In Test Methodology for VLSI Data Paths.
%U http://dblp.uni-trier.de/db/conf/itc/itc1984.html#KimeKLW84
@inproceedings{conf/itc/KimeKLW84,
added-at = {2002-11-22T00:00:00.000+0100},
author = {Kime, Charles R. and Kwan, H. H. and Lemke, J. K. and Williams, Gerald B.},
biburl = {https://www.bibsonomy.org/bibtex/298e847d020cf320acb4c9fa19288f864/dblp},
booktitle = {ITC},
crossref = {conf/itc/1984},
date = {2002-11-22},
description = {dblp},
interhash = {8834f044f3a8f3c5a20fd6eed0e7a91c},
intrahash = {98e847d020cf320acb4c9fa19288f864},
keywords = {dblp},
pages = {327-337},
publisher = {IEEE Computer Society},
timestamp = {2002-11-22T00:00:00.000+0100},
title = {A Built-In Test Methodology for VLSI Data Paths.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc1984.html#KimeKLW84},
year = 1984
}
