%0 Conference Paper %1 conf/irps/LeurquinVGMDIMC23 %A Leurquin, Camille %A Vandendaele, William %A Gwoziecki, Romain %A Mohamad, B. %A Despesse, Ghislain %A Iucolano, Ferdinando %A Modica, Roberto %A Constant, Aurore %B IRPS %D 2023 %I IEEE %K dblp %P 1-6 %T Drain voltage impact on charge redistribution in GaN-on-Si E-mode MOSc-HEMTs. %U http://dblp.uni-trier.de/db/conf/irps/irps2023.html#LeurquinVGMDIMC23 %@ 978-1-6654-5672-2

@inproceedings{conf/irps/LeurquinVGMDIMC23, added-at = {2024-07-08T00:00:00.000+0200}, author = {Leurquin, Camille and Vandendaele, William and Gwoziecki, Romain and Mohamad, B. and Despesse, Ghislain and Iucolano, Ferdinando and Modica, Roberto and Constant, Aurore}, biburl = {https://www.bibsonomy.org/bibtex/2714a719e03da9a170a51718c14747977/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2023}, ee = {https://doi.org/10.1109/IRPS48203.2023.10117813}, interhash = {895f22b215ffff4a8b029af65c4bd1fc}, intrahash = {714a719e03da9a170a51718c14747977}, isbn = {978-1-6654-5672-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-07-15T07:17:46.000+0200}, title = {Drain voltage impact on charge redistribution in GaN-on-Si E-mode MOSc-HEMTs.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2023.html#LeurquinVGMDIMC23}, year = 2023 }