%0 Journal Article %1 journals/tcad/PomeranzR10b %A Pomeranz, Irith %A Reddy, Sudhakar M. %D 2010 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 7 %P 1135-1140 %T On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits. %U http://dblp.uni-trier.de/db/journals/tcad/tcad29.html#PomeranzR10b %V 29

@article{journals/tcad/PomeranzR10b, added-at = {2020-09-24T00:00:00.000+0200}, author = {Pomeranz, Irith and Reddy, Sudhakar M.}, biburl = {https://www.bibsonomy.org/bibtex/238d15c86e673f93c667538f5e35270e3/dblp}, ee = {https://doi.org/10.1109/TCAD.2010.2046448}, interhash = {92e96c6bd8ca30bec6b807dc0fa2485c}, intrahash = {38d15c86e673f93c667538f5e35270e3}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 7, pages = {1135-1140}, timestamp = {2020-09-25T11:45:35.000+0200}, title = {On Clustering of Undetectable Single Stuck-At Faults and Test Quality in Full-Scan Circuits.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad29.html#PomeranzR10b}, volume = 29, year = 2010 }