%0 Conference Paper %1 conf/iscit/OhtaniOHYL17 %A Ohtani, Kouhei %A Osato, Naho %A Hashizume, Masaki %A Yotsuyanagi, Hiroyuki %A Lu, Shyue-Kung %B ISCIT %D 2017 %I IEEE %K dblp %P 1-5 %T A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume. %U http://dblp.uni-trier.de/db/conf/iscit/iscit2017.html#OhtaniOHYL17 %@ 978-1-5090-6514-1

@inproceedings{conf/iscit/OhtaniOHYL17, added-at = {2018-01-31T00:00:00.000+0100}, author = {Ohtani, Kouhei and Osato, Naho and Hashizume, Masaki and Yotsuyanagi, Hiroyuki and Lu, Shyue-Kung}, biburl = {https://www.bibsonomy.org/bibtex/20c3fd47427e1fdbca6e8b650747c8afe/dblp}, booktitle = {ISCIT}, crossref = {conf/iscit/2017}, ee = {https://doi.org/10.1109/ISCIT.2017.8261176}, interhash = {948b20e0c943015a1052b31da1715136}, intrahash = {0c3fd47427e1fdbca6e8b650747c8afe}, isbn = {978-1-5090-6514-1}, keywords = {dblp}, pages = {1-5}, publisher = {IEEE}, timestamp = {2018-02-01T11:37:38.000+0100}, title = {A defect level monitor of resistive open defect at interconnects in 3D ICs by injected charge volume.}, url = {http://dblp.uni-trier.de/db/conf/iscit/iscit2017.html#OhtaniOHYL17}, year = 2017 }