Inproceedings,
Multiple fault activation cycle tests for transistor stuck-open faults.
N. Devta-Prasanna, A. Gunda, S. Reddy, and I. Pomeranz.ITC, page 821. IEEE Computer Society, (2010)
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- conf/itc/Devta-PrasannaGRP10
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- inproceedings
- booktitle
- ITC
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- 2010
- pages
- 821
- publisher
- IEEE Computer Society
- crossref
- conf/itc/2010
- ee
- https://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699313
- isbn
- 978-1-4244-7206-2
- url
- http://dblp.uni-trier.de/db/conf/itc/itc2010.html#Devta-PrasannaGRP10
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%1 conf/itc/Devta-PrasannaGRP10
%A Devta-Prasanna, Narendra
%A Gunda, Arun
%A Reddy, Sudhakar M.
%A Pomeranz, Irith
%B ITC
%D 2010
%E Press, Ron
%E Volkerink, Erik H.
%I IEEE Computer Society
%K dblp
%P 821
%T Multiple fault activation cycle tests for transistor stuck-open faults.
%U http://dblp.uni-trier.de/db/conf/itc/itc2010.html#Devta-PrasannaGRP10
%@ 978-1-4244-7206-2
@inproceedings{conf/itc/Devta-PrasannaGRP10,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Devta-Prasanna, Narendra and Gunda, Arun and Reddy, Sudhakar M. and Pomeranz, Irith},
biburl = {https://www.bibsonomy.org/bibtex/212720e487f06ea3b507afe7d0e759852/dblp},
booktitle = {ITC},
crossref = {conf/itc/2010},
editor = {Press, Ron and Volkerink, Erik H.},
ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699313},
interhash = {9c8e7d61c461602473868da2ad7da0e7},
intrahash = {12720e487f06ea3b507afe7d0e759852},
isbn = {978-1-4244-7206-2},
keywords = {dblp},
pages = 821,
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T04:27:14.000+0200},
title = {Multiple fault activation cycle tests for transistor stuck-open faults.},
url = {http://dblp.uni-trier.de/db/conf/itc/itc2010.html#Devta-PrasannaGRP10},
year = 2010
}