%0 Journal Article %1 journals/mr/MonsieurVRBPG02 %A Monsieur, Frederic %A Vincent, E. %A Roy, David %A Bruyère, S. %A Pananakakis, G. %A Ghibaudo, Gérard %D 2002 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1505-1508 %T Gate oxide Reliability assessment optimization. %U http://dblp.uni-trier.de/db/journals/mr/mr42.html#MonsieurVRBPG02 %V 42

@article{journals/mr/MonsieurVRBPG02, added-at = {2020-02-22T00:00:00.000+0100}, author = {Monsieur, Frederic and Vincent, E. and Roy, David and Bruyère, S. and Pananakakis, G. and Ghibaudo, Gérard}, biburl = {https://www.bibsonomy.org/bibtex/26a6bd6c0eac6da17a56ed6491448209e/dblp}, ee = {https://doi.org/10.1016/S0026-2714(02)00179-8}, interhash = {a280e21fa030da4b77f5a8fdee66b2ff}, intrahash = {6a6bd6c0eac6da17a56ed6491448209e}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1505-1508}, timestamp = {2020-02-25T13:25:30.000+0100}, title = {Gate oxide Reliability assessment optimization.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr42.html#MonsieurVRBPG02}, volume = 42, year = 2002 }