%0 Conference Paper %1 conf/3dic/HashizumeUYL14 %A Hashizume, Masaki %A Umezu, Shoichi %A Yotsuyanagi, Hiroyuki %A Lu, Shyue-Kung %B 3DIC %D 2014 %I IEEE %K dblp %P 1-6 %T A built-in supply current test circuit for electrical interconnect tests of 3D ICs. %U http://dblp.uni-trier.de/db/conf/3dic/3dic2014.html#HashizumeUYL14 %@ 978-1-4799-8472-5

@inproceedings{conf/3dic/HashizumeUYL14, added-at = {2017-05-21T00:00:00.000+0200}, author = {Hashizume, Masaki and Umezu, Shoichi and Yotsuyanagi, Hiroyuki and Lu, Shyue-Kung}, biburl = {https://www.bibsonomy.org/bibtex/2b36f55edf62d940b8b92197b1a16a531/dblp}, booktitle = {3DIC}, crossref = {conf/3dic/2014}, ee = {https://doi.org/10.1109/3DIC.2014.7152148}, interhash = {a509593d332c871c47b8d3c6a9b28eff}, intrahash = {b36f55edf62d940b8b92197b1a16a531}, isbn = {978-1-4799-8472-5}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2019-10-17T15:31:22.000+0200}, title = {A built-in supply current test circuit for electrical interconnect tests of 3D ICs.}, url = {http://dblp.uni-trier.de/db/conf/3dic/3dic2014.html#HashizumeUYL14}, year = 2014 }